Postdoctoral Fellow (PREP0003261)

Key responsibilities will include but are not limited to:

• Plan and conduct research on advanced X-ray metrologies to determine structural (physical and chemical) properties of blanket (non-patterned) thin films on Si and SiC wafers
• Use X-ray characterization methods, such as X-ray reflectivity, X-ray fluorescence, X-ray photoelectron spectroscopy, to determine the structural properties of thin film samples
• Use open-source (python) fitting methods to constrain structural models, determine uncertainties, and combined these properties into a hybrid metrology digital wafer
• Perform wafer dicing, cleaning, and packaging of samples for distribution as a Research Grade Test Material to pair with the previously-determined digital wafer model
• Publish results in refereed scientific journals and present results at conferences and meetings

Qualifications:

• PhD in physics, materials science, or another related field
• Background in X-ray measurement technique(s) required, either X-ray reflectivity, X-ray fluorescence, or X-ray photoelectron spectroscopy
• Background in programming and/or data modeling using python (or equivalent) recommended
• Familiarity with thin film deposition and clean room access protocols, preferred
• Strong oral and written communication skills
• Ability to work productively as part of a team and independently

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PREP is a 5-year cooperative agreement between NIST laboratories and participating PREP Universities to establish a collaborative research relationship between NIST and U.S. institutions of higher education in the following disciplines including (but may not be limited to) biochemistry, biological sciences, chemistry, computer science, engineering, electronics, materials science, mathematics, nanoscale science, neutron science, physical science, physics, and statistics. This collection of information is needed to facilitate administrative functions of the PREP Program.

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